Welcome to
Eon - open access scholarly journal
open to reflections on the transformative potential of our times through the lenses of philosophy, literature, cultural studies, theology, anthropology, and communication studies.


ISSN-L 2734 - 8296  
Print ISSN 2734 - 8296

About us

Eon is a newly founded biannual and open access scholarly journal. Articles are evaluated in a double-blind peer review procedure and are scanned with a plagiarism software, in order to ensure academic integrity.

Eon is a scholarly journal committed to international standards of publishing and it is edited by an experienced team of experts in several scholarly fields and research areas. We aim to contribute to the dissemination of relevant knowledge and to build bridges between cultures and generations of researchers.

The peer review evaluations serve to guide authors through the submission and revision of their original articles, and all submissions are treated with strict  confidentiality.

We publish original researches in the fields of philosophy, literature, cultural studies, theology, anthropology, and communication studies. As the editorial team is in the process of expending, we  also aim to publish studies on history, art and political thinking.

License Creative Commons
The content of this site is licensed under Creative Commons Attribution 4.0 International license.

Call for papers

The authors are invited to send us the articles (full-length articles, essays, and reviews) for publication, for the vol. 2, nr. 2 / 2021, at revista.eon2020@gmail.com 

Deadline: October 31, 2021.

The texts must comply the general standards for scholarly publishing. All submissions must be accompanied by an abstract, 4-6 keywords, references, and a short bionote of the author. 

The expected length of articles: between 4.500 and 6.000 words for full-length articles; essays will be between 3.500 and 4.000 words and reviews between 1.000 and 1.700 words. 

Articles and other submissions ought to follow the citation conventions as laid out in The Chicago Manual of Style

The articles submitted are evaluated in a double-blind peer review procedure and are automatically scanned with a plagiarism software: Plagiarisma.net


Eon publishes texts in English, Romanian, French and German, and does not charge any fees for publications.

The authors retain the copyright and full publishing rights without restrictions.